SIMS: Basic Principles and Components

National Research Nuclear University MEPhI의 강좌에서
Methods of Surface Analysis
11개의 평가
National Research Nuclear University MEPhI
11개의 평가
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

강사 만나기

  • Sadovsky Yaroslav
    Sadovsky Yaroslav
    Department of Plasma Physics

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