SIMS: Examples

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4.8(97개의 평가)
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KR

Apr 08, 2020

I am currently doing research on thin film. This course is going to help me a lot. Thanks a lot to the Professor. He is amazing.

CL

Jul 11, 2020

As a researcher, this course helped a lot in identifying which surface analysis should be appropriately used.

수업에서
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

강사:

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    Sadovsky Yaroslav

    Assistant

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